Agilent 5990-3672EN Keysight Pulsed-IV Parametric Test Solution - Selection Guide c20140829 [12] free download

File name 5990-3672EN Keysight Pulsed-IV Parametric Test Solution - Selection Guide c20140829 [12].pdf

Keysight Technologies Pulsed-IV Parametric Test Solutions Selection Guide Introduction Pulsed-IV parametric testing is becoming an increasingly common requirement for the development of semiconductor process and the evaluation of semiconductor devices. In recent years, the need for very accurate pulsed IV measurement has increased due to the development of more advanced pro- cesses utilizing exotic materials, the push for devices with lower power consumption, and many other factors. To meet these needs Keysight Technologies, Inc. offers a variety of pulsed-IV parametric test solutions that supply the widest range of pulse widths, voltage/current output, and performance available in the industry. Each solution is well-proven and has already been used by many researchers worldwide to meet various advanced measurement needs. These range from the process development of cutting- edge technologies utilizing high-k gate dielectrics and SOI transistors to the evaluation of more conventional semiconductor process such as GaAs and HEMT or new materials such as SiC, GaN or Organic devices which require both high voltage and high current measurement capabilities. This selection guide provides an overview and side-by-side comparison of all of Keysight's pulsed-IV parametric test solutions to enable you to determine the best solution to meet your unique needs. Table 1. Multiple options for advanced pulsed measurement needs Selecting the Best Solution to Meet Your Measurement Needs This selection guide is designed to 5. Software is also key factor to need to put sufficient forethought assist you in comparing Keysight's control measurement equipment into the creation of the test struc- pulsed-IV measurement solutions or to synchronize two or more tures that will be used to make the and selecting the best one for your equipment on the Pulsed IV measurement. Attempts to make fast measurement applications. By measurement. In some cases, the pulsed measurements with conven- following the steps outlined below calculation is required to evaluate tional DC test structures using DC you should be able to determine the current from voltage. Keysight sup- positioners are in general unlikely to proper measurement solution to meet plies a library of application tests yield good measurement results. In your needs. for performing pulsed IV measure- general, fast pulsed measurements ment on the EasyEXPERT software. require test structures designed 1. For each of the pulsed-IV specifica- for a ground-signal (GS)